Quality & Reliability
In defense procurement, reliability is proven by equipment and process, not by a line in a brochure.
Design through production, one roof
Semiconductor IP design, product design, SMT assembly and test all happen in-house. Whether a fault sits in the controller or in the assembly, the same team traces it.
Domestic design, dependable supply chain
The core design assets are held in Korea, so a foreign vendor’s end-of-life notice or an export-control decision does not dictate the schedule. In defense procurement, continuity of supply is reliability.
Long-term supply
From the 2005 PATA SSD onward we keep shipping interfaces the market abandoned. Legacy support is a commitment, not a leftover.
Certification
ISO 9001:2015 quality management system
PaxDisk was certified to ISO 9001 / KS Q ISO 9001 in September 2013 and has run the whole storage-device manufacturing process under a documented quality system ever since.
| Standard | ISO 9001:2015 / KS Q ISO 9001:2015 |
|---|---|
| Scope | Manufacture of storage devices, photoelectric amplifier modules and current sensor modules |
| First certified | 13 September 2013 |
| Certification body | Ace Certification (JAS-ANZ · IAF MLA) |
| Status | Active |
Environmental
Defense-grade environmental specification
The figures below apply across the PaxDisk SSD line-up.
| Item | Specification | Note |
|---|---|---|
| Operating temperature | -40°C ~ +85°C | Common to the defense and industrial grades. Custom builds go down to -60°C. |
| Shock | 1,500G, 0.5ms | Common to the whole line-up. |
| Vibration | 16.32G rms | Common to the whole line-up. |
| Altitude | -1,200 ~ 120,000ft | Common to the whole line-up. |
| Humidity | 5% ~ 95% | Common to the whole line-up. |
Per-product environmental figures are on each product page. Test reports are shared, within the limits we are permitted, alongside a quotation or technical enquiry.
Infrastructure
Test & production infrastructure
Thermal shock chamber
In-house verification of the -40°C to +85°C defense-grade temperature range.
Thermal shock chamber 2
In-house verification of the -60°C to +150°C temperature-grade range.
SMT line
Design through assembly in-house, keeping the supply chain short.
Lab & Measurement
Test & measurement equipment we own
From device characterisation (I-V, LCR) through RF spectrum and 20 GHz TDR to SATA-class high-speed serial compliance — we own the instruments needed to measure what we design.
High-speed serial
High-speed serial & compliance
Signal integrity and standards compliance of high-speed serial interfaces such as SATA are tested in-house. The company that designed the interface IP measures the signal itself.
Tektronix
DSA71604
16 GHz real-time digital serial analyser — eye diagrams, jitter decomposition, serial bus compliance analysis
Tektronix
AWG7102
10 GS/s arbitrary waveform generator — receiver (RX) tolerance testing with stressed signals and injected jitter
Tektronix
TDS8000B + 80E04 · 80A05
Sampling oscilloscope — impedance and transmission-line characterisation on a 20 GHz TDR module, plus 10G-class clock-recovery eye analysis
RF · Spectrum · Phase noise
RF, spectrum & phase noise
Clock harmonics and radiated components are checked on the bench, and phase noise — the root of clock jitter — is quantified. We were the first in the industry to apply phase-noise measurement to SSDs (2017).
Hewlett-Packard
HP 8566B
22 GHz spectrum analyser — RF spectrum, clock harmonics, pre-compliance EMI checks
Hewlett-Packard
HP 8561E
30 Hz – 6.5 GHz spectrum analyser — precision analysis in the lower frequency bands
Agilent
N5500A + 70420A
Phase-noise measurement system — quantifying clock and oscillator phase noise, the root cause of jitter (industry-first application to SSDs)
Device-level
Device-level characterisation
Measurement starts at the device, not the board — the starting point for component screening and failure analysis.
Hewlett-Packard
HP 4145B
Semiconductor parameter analyser — I-V characterisation of transistors and diodes
Keysight
E4980AL
Precision LCR meter — impedance and C-V characterisation of passives and semiconductors
Hewlett-Packard
HP 4286A
RF LCR meter (1 MHz – 1 GHz) — impedance characterisation of components at RF
Measurement requests and test-scope discussions come through the quote request form. The instruments and the test environment can be seen on a site visit.
Need test data or a datasheet?
Tell us the standard and the application, and we will confirm what we can release.